April 30, 2021

JEDEC Wide Bandgap Power Semiconductor Committee Publishes a Milestone Document for Bias Temperature Instability of Silicon Carbide (SiC) MOS Devices

ARLINGTON, Va.–(BUSINESS WIRE)–JEDEC publishes JEP184, a new guideline from its JC-70.2 Wide Bandgap Silicon Carbide (SiC) subcommittee. For free download visit www.jedec.org.


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